ACTIVE-LIT – Automated testing solution system allows non-contact failure inspection of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss can be measured with Lock-in Thermography. This is achieved by using the shortest measurement times combined with a high-performance thermographic camera and a specialised lock-in procedure.

The power supply for this process is clocked with a synchronisation module and failures that produce mK or even μK differences are reliably detected.

Smallest defects like point and line shunts, oxide failures, transistor and diode failures on a PCB surface and in IC´s can be detected and displayed in x and y positions. Additionally, it is possible to analyse stacked-die packages or multi-chip modules in z-direction with merely changing the lock-in frequency.

Automated Testing Solution ACTIVE-LIT - Failure

Benefits of the Modular Test Bench

  • Online lock-in measurement with the highest sensitivity
  • Complete and detailed microscopy analysis
  • Geometrical resolution up to 1.3 μm per pixel with microscope lenses
  • Thermal resolution in the microkelvin range
  • Multi-layer analysis
  • Automatic scanning of larger samples due to precision mechanics
Automated Testing Solution ACTIVE-LIT - Modular test bench

Thermographic Images with Different Optics

Automated Testing Solution ACTIVE-LIT - Telephoto lens

Telephoto Lens 100 mm

100 mm telephoto lens with 500 mm close-up; pixel resolution 75 μm

Automated Testing Solution ACTIVE-LIT - Microscopic lens

Microscopic Lens 1×

1x microscopic lens; pixel resolution 15 μm

Automated Testing Solution ACTIVE-LIT - Microscopic lens

Microscopic Lens 3×

3x microscopic lens; pixel resolution 5 μm

Get in contact with InfraTec thermography division

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It is not unusual for tasks to be associated with special requirements. Discuss your specific application needs with our specialists, receive further technical information or learn more about our additional services.

Great Britain

InfraTec infrared Ltd
Dunston Innovation Centre, Dunston Road

Thermographic Software IRBIS® 3 active

  • Operational software with comprehensive analysis options in laboratory conditions
  • Software add-on for automatic error classification based on parameter settings
  • Intuitive user interface for easy operation
  • Real-time display of the object being measured in various states
  • Multifaceted memory options for image data and measurement results
  • Alternative 0°, 90° or customised set phase angle image for representation of complex intensity information
  • Merging live and amplitude image
  • Optional: IV measurement, under sampling, drift compensation, DC-mode, power loss measurement, user and protocol administration, interface preparation: e.g. Profibus, Ethernet Automated Testing Solution ACTIVE-LIT Electronic / Semiconductor Testing Using Active Lock-in Thermography Software
Automated Testing Solution ACTIVE-LIT - Software

Automated Lock-In measurement with ACTIVE-LIT from InfraTec

Automated Lock-In measurement with ACTIVE-LIT from InfraTec


Infrared Cameras for ACTIVE-LIT