Fault Isolation on Chips and Power Modules
STMicroelectronics is a European manufacturer of semiconductor devices and integrated circuits with locations worldwide. Their products are mainly used in the automotive industry and for the Internet of Things (IoT). The company performs non-destructive failure analysis of chips, discrete components, sensors, LEDs and power modules using InfraTec's E-LIT system in Shenzhen (China) and Calamba (Philippines).
The E-LIT solution employs lock-in thermography, a method, in which local defects are detected and analysed based on thermal anomalies generated by defined electrical excitation of an electronic component or assembly. At STMicroelectronics, the test system – comprising an excitation source, an infrared camera with adjustable Z-axis positioning and various lenses, an X-Y table, and additional accessories – was integrated into the failure analysis laboratory. The E-LIT system was further enhanced with a binocular to enable the connection of power supply contacts to the tested components.
InfraTec Solution
STMicroelectronics N.V.
Non-destructive failure analysis of chips, discrete components, sensors, LEDs and power modules
www.stm.com
Automation solution / Thermal imaging system:
E-LIT
During electrical activation of components under investigation, changes in surface temperature are measured using a high-end infrared camera from the ImageIR® series to identify so-called "hot spots”. This allows even the smallest defects, such as point and line short circuits, oxidation, and faults in transistors and diodes within circuits, which cause only minimal temperature deviations in the millikelvin (mK) or microkelvin (μK) range, to be detected.
For the analysis of large components, the E-LIT system is equipped with 25 mm lenses that provide a wide field of view, along with several microscope lenses capable of resolving fine details up to 1,3 µm. Hot spots can be detected with high sensitivity at chip level using as little as 2 μA. To excite power modules, high voltages up to 3 kV are applied. The analysis is performed using InfraTec’s IRBIS® 3 active online operating software, which offers a wide range of comprehensive analysis functions. The use of various colour palettes, including inverted and weighted modes, has proven particularly effective for fault detection. By sharing their practical experience, users help InfraTec continuously enhance the E-LIT system for new test objects and faster results — and in return, they promptly benefit from updates and advancements.
Lock-in thermography is a key method at STMicroelectronics for identifying faults in electrical components. The user-friendly method is especially effective in exactly locating short circuits and other anomalies. Users particularly appreciate the simple visual identification of faults and the flexibility of the system for measurements on different components such as ICs, sensors, LEDs or power modules. The E-LIT solution played a crucial role in the approval of a new mass production project in Calamba, where it was used to quickly pinpoint hot spot locations across multiple batches.
